Atomic-scale snapshots in three dimensions may soon be possible, thanks to a new X-ray device developed by researchers at Stanford University, US. The microscope, developed by Jianwei Miao and colleagues, has so far been used to image structures down to 8 nm. Reaching the atomic scale of a few tenths of a nanometre should come from using brighter X-ray beams or longer exposures.
CERN Courier
Oct 1, 2002